Reliability Approximation of Weibull Density with Squared Error Loss Function

Abstract

Weibull distribution and failure censoring (type I) play an important role in life testing and reliability engineering. The failure censoring (type I) can improve the efficiency of test by allowing testers to assign a pre-assigned number of units to different test facilities. In this paper, we have obtained the bayes estimator of reliability as well as the Approximate Bayes Estimator of two parameter Weibull population by Lindley Approximation Method under Squared error loss function (SQELF). A numerical comparison is done and is found that proposed approximate Bayes estimator of Reliability function perform better than ML Estimator.